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光學式機台校正檢測裝置 |
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 專利名稱 |
光學式機台校正檢測裝置
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| 專利證書號 |
8,542,358
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| 專利權人 |
國立虎尾科技大學 |
| 專利國家 |
美國, |
| 發明人 |
覺文郁,吳家鴻,陳怡靜,徐東暉,枋仁傑,楊登宇 |
| 應用領域 |
光電與電子類 |
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專利商品特色：
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An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
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聯繫方式 |
| 聯絡人： 國立虎尾科技大學 產學合作處/智財組 王偉儒 |
 與我連絡 |
| 地址： 632雲林縣虎尾鎮文化路64號 |
電話： 05-631-5561 |
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